ECE department,, GITAM University,
ELECTRONICS AND COMMUNICATION ENGINEERING, Anil Neerukonda Institute of Technology& Sciences
Surface roughness measurement is widely used to estimate the quality of the product during manufacturing processes. It has a great importance in manufacturing fields such as ceramic tiles, glass, and iron. Many are using surface profile-meter with a contact stylus to measure the surface roughness of work piece. In the stylus method, a stylus is moved along the surface and the vertical movement of the stylus is recorded to measure surface roughness. This method has the disadvantage that work piece surface may damage due to direct contact between the surface and the stylus. In this paper, we propose a novel technique to find the roughness parameters of a surface by using image processing techniques like Contrast stretching and Bi-cubic interpolation techniques of image enhancement. In these techniques, firstly the surface image of the work pieces is acquired using the digital camera and it is pre-processed in order to remove noise and then image enhancement is done followed by parameters analysis. The roughness parameters such as average surface roughness (Ra), Maximum valley profile depth (Rv (Valley)), Highest peak (Rp (Peak)), Root-mean-square (rms) roughness (Rq (rms)) were determined using above techniques. The results obtained by the both methods are tabulated and compared.